[P-3-18] Anomalous Hot-Carrier-Induced Saturation Drain Current Degradation in DEMOS Transistors

J. F. Chen¹, K. W. Lin¹, S. Y. Chen¹, K. M. Wu², J. R. Shih², K. Wu² (1.National Cheng Kung Univ.(Taiwan), 2.TSMC(Taiwan))

https://doi.org/10.7567/SSDM.2009.P-3-18