[P-4-3] Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique

R. Degraeve¹、M. Zahid¹、G. Van den bosch¹、P. Blomme¹、L. Breuil¹、B. Kaczer¹、M. Mercuri¹、A. Rothschild¹、A. Cacciato¹、M. Jurczak¹、G. Groeseneken²、J. Van Houdt¹ (1.IMEC(Belgium)、2.Catholic Univ. Leuven(Belgium))

https://doi.org/10.7567/SSDM.2009.P-4-3