Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique

R. Degraeve; M. Zahid; G. Van den bosch; P. Blomme; L. Breuil; B. Kaczer; M. Mercuri; A. Rothschild; A. Cacciato; M. Jurczak; G. Groeseneken; J. Van Houdt

doi:https://doi.org/10.7567/SSDM.2009.P-4-3

[P-4-3] Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique

R. Degraeve¹, M. Zahid¹, G. Van den bosch¹, P. Blomme¹, L. Breuil¹, B. Kaczer¹, M. Mercuri¹, A. Rothschild¹, A. Cacciato¹, M. Jurczak¹, G. Groeseneken², J. Van Houdt¹ (1.IMEC(Belgium), 2.Catholic Univ. Leuven(Belgium))

https://doi.org/10.7567/SSDM.2009.P-4-3

2009 International Conference on Solid State Devices and Materials

[P-4-3] Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique