The Japan Society of Applied Physics

382件中(291 - 300)

[J-5-02] Operando Hard X-ray Photoelectron Spectroscopy Study of Buried Interface Chemistry of Au/In2O3/Al2O3/p+-Si Stacks under Applied Bias

〇Ibrahima Gueye1、Riku Kobayashi1,2、Shigenori Ueda1、Toshihide Nabatame3、Kazuhito Tsukagoshi3、Atsushi Ogura2,4、Takahiro Nagata1,2,3 (1.National Institute for Materials Science (NIMS), Research Center for Functional Materials, 1-1 Namiki, Tsukuba, Ibaraki 305-0044、2.Graduate School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki, Kanagawa 214-8571、3.International Center for Materials Nanoarchitectonics (WPI-MANA), NIMS, 1-1 Namiki, Tsukuba, Ibaraki 305-0044、4.Meiji Renewable Energy Laboratory, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki, Kanagawa 214-8571)

2021 International Conference on Solid State Devices and Materials |2021年9月8日(水) 14:30 〜 14:37 |PDF ダウンロード

[J-5-04] Study on Negative-Bias Photodegradation Mechanism in IGZO FET with First -Principles Calculation

〇Tomonori Nakayama1、Masahiro Takahashi1、Hitoshi Kunitake1、Kuo-Chang Huang2、Hiroshi Yoshida2、Miller Liao3、Shou-Zen Chang2、Shunpei Yamazaki1 (1.Semiconductor Energy Laboratory Corp., Ltd、2.Powerchip Semiconductor Manufacturing Corp.、3.National Taiwan Univ.)

2021 International Conference on Solid State Devices and Materials |2021年9月8日(水) 14:44 〜 14:51 |PDF ダウンロード

382件中(291 - 300)