[J-3-05] High-Efficiency and Wide-Load Current Range LDO Regulator with Dynamic Loop Gain Control Technique
2023 International Conference on Solid State Devices and Materials
|Thu. Sep 7, 2023
633 results (211 - 220)
[J-4-01 (Invited)] Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips
2023 International Conference on Solid State Devices and Materials
|Thu. Sep 7, 2023
[J-4-02] Total Ionizing Dose Effect by Gamma-ray Irradiation and Recovery Phenomenon by Applying High Gate Bias to Commercial SiC Power MOSFETs
2023 International Conference on Solid State Devices and Materials
|Thu. Sep 7, 2023
[J-4-03] Gate-controlled Gain Tuning of FDSOI-based 1T Pixel for In-Sensor White Balance
2023 International Conference on Solid State Devices and Materials
|Thu. Sep 7, 2023
[J-4-04] A High-Accuracy Time-of-Flight Image Sensor Using Cascaded 4-Tap Demodulators and Dual-Phase Short-Pulse Modulation
2023 International Conference on Solid State Devices and Materials
|Thu. Sep 7, 2023
[J-5-01 (Invited)] Impact of Spintronics-Based Nonvolatile Hardware for AI Applications
2023 International Conference on Solid State Devices and Materials
|Fri. Sep 8, 2023
[J-5-02] Design of an SOT-Based Self-Terminated Nonvolatile Register for Write/Leakage-Energy-Minimized Backup Operation
2023 International Conference on Solid State Devices and Materials
|Fri. Sep 8, 2023
[J-5-03] Hardware-conscious Software Training for Deep Neural Network Inference Accelerator Chips to Recover Accuracy Degradation due to Hardware Variabilities
2023 International Conference on Solid State Devices and Materials
|Fri. Sep 8, 2023
[J-5-04 (Late News)] A Highly Efficient STT-MRAM-Based IndRNN Accelerator with Approximate Dictionary Encoded Weight for Edge AI Devices
2023 International Conference on Solid State Devices and Materials
|Fri. Sep 8, 2023
[K-1-01 (Invited)] A Deep Look into the Endurance Degradation in Silicon Ferroelectric FET
2023 International Conference on Solid State Devices and Materials
|Wed. Sep 6, 2023