The 74th JSAP Autumn Meeting,2013

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13. Semiconductors A (Silicon) » 13.6 Silicon devices / Integration technology

[20a-C8-1~12] 13.6 Silicon devices / Integration technology

Fri. Sep 20, 2013 9:00 AM - 12:15 PM C8 (TC3 2F-201)

11:30 AM - 11:45 AM

[20a-C8-10] Methodology for Evaluating Operation Temperature of FinFETs in a Circuit

○(P)Tsunaki Takahashi1, Shunri Oda2, Ken Uchida1 (Keio Univ.1, Tokyo Inst. Tech.2)

Keywords:FinFET,自己加熱効果,熱特性モデル化