2016年 第77回応用物理学会秋季学術講演会

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一般セッション(口頭講演)

13 半導体 » 13.2 探索的材料物性・基礎物性

[15a-B3-1~9] 13.2 探索的材料物性・基礎物性

2016年9月15日(木) 09:00 〜 11:15 B3 (展示控室3)

末益 崇(筑波大)、山口 憲司(量研機構)

10:30 〜 10:45

[15a-B3-7] Fabrication of nitrogen-doped BaSi2 films on Si(111) by molecular beam epitaxy

Zhihao Xu1、Tianguo Deng1、Ryota Takabe1、Miftahullatif Emha Bayu1、Kaoru Toko1、Takashi Suemasu1 (1.Univ. Tsukuba)

キーワード:Nitrogen doped barium disicide

BaSi2 is a good candidate for future solar cell material, because its band gap is 1.3 eV, suitable for the solar spectrum. Besides, it also has a large absorption coefficient 3×104 cm-1 at 1.5 eV [1]. The minority-carrier diffusion length of undoped BaSi2 is approximately 10 μm [2]. On the basis of these results, we aim to realize BaSi2 pn junction solar cells. For n-type BaSi2, we once attained the electron concentration of 1020 cm-3 for Sb-doped BaSi2[3], whereas Sb is easy to diffuse into other layers [4], which might destroy a sharp pn junction required for solar cell. Therefore, exploring alternative donor impurity is very important. BaSi2 films doped with a Group 15th element (P, As, Sb) except N have been grown, which all exhibit the n-type conductivity. In this study, we attempted to form N-doped BaSi2 films and characterized their properties.