Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[21p-C206-1~13] 7.1 X-ray technologies

Wed. Sep 21, 2022 1:30 PM - 5:00 PM C206 (C206)

Akio Yoneyama(SAGA Light Source), Masahiko Ishino(QST)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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1:30 PM - 1:45 PM

[21p-C206-1] Design of high diffraction efficiency and high resolution soft X-ray laminar type multilayer gratings for 2-4 keV region (II)

〇Masato Koike^1,2,3, Tadashi Hatano², Alexander Pirozhkov¹, Yoshihiro Ueno⁴, Masami Terauchi² (1.QuBS, QST, 2.IMRAM, Tohoku Univ., 3.Dept. of Eng., Osaka Metro. Univ., 4.Tech. Res. Lab., Shimadzu Corp.)

1:45 PM - 2:00 PM

[21p-C206-2] Development of the soft x-ray laser irradiation beamline with an intensity monitor

〇Masahiko Ishino¹, Thanh-Hung Dinh¹, Tadashi Hatano², Noboru Hasegawa¹, Masaharu Nishikino¹ (1.QST, 2.Tohoku Univ.)

2:00 PM - 2:15 PM

[21p-C206-3] Absolute Value Correction Method for EUV Reflectometer

〇(D)Shuntarou Waki¹, Yusuke Tsukui¹, Jun Chen¹, Mitsunori Toyoda¹ (1.Tokyo Polytechnic Univ.)

2:15 PM - 2:30 PM

[21p-C206-4] Correction of Coma Aberrations on High Magnification Objective for EUV Microscopy

〇Yusuke Tsukui¹, Shuntaro Waki¹, Mashine Iori¹, Jun Chen¹, Mitsunori Toyoda¹ (1.Tokyo Polytechnic Univ.)

2:30 PM - 2:45 PM

▲ [21p-C206-5] Characteristics of the extreme ultraviolet spectrum from a laser produced plasma

〇Nozomi Tanaka¹, Yubo Wang¹, Katsunobu Nishihara¹, Shinsuke Fujioka¹, Atsushi Sunahara^1,2, Tomoyuki Johzaki^1,3, Kyung Sik Kang⁴, Youngduk Suh⁴, Jeong-Gil Kim⁴, Shinji Ueyama⁵, Ken Ozawa⁵ (1.ILE, Osaka Univ., 2.Purdue Univ., 3.Hiroshima Univ., 4.Samsung MR, 5.Samsung R&D Inst.)

2:45 PM - 3:00 PM

▼ [21p-C206-6] A high-transmittance Schwarzschild objective (SO) to focus high-intensity EUV-VUV light from laser-plasma light source

〇(M2)Yubo Wang¹, Tanaka Nozomi¹, Katsunobu Nishihara¹, Shinsuke Fujioka¹, Atsushi Sunahara^1,2, Tomoyuki Johzaki^1,3, Kyung Sik Kang⁴, Youngduk Suh⁴, Jeong-Gil Kim⁴, Shinji Ueyama⁵, Ken Ozawa⁵ (1.ILE Osaka Univ., 2.Purdue University, 3.Hiroshima University, 4.Samsung MR, 5.Samsung R&D Institute Japan)

3:00 PM - 3:15 PM

[21p-C206-7] Measurement of Sn ion energy to extend lifetime of the collector mirror for EUV light source

〇Yoshiyuki Honda¹, Shinji Nagai¹, Hirokazu Hosoda¹, Yuto Nakayama², Takeru Niinuma², Masaki Kume², Takeshi Higashiguchi² (1.Gigaphoton Inc., 2.Utsunomiya Univ.)

3:30 PM - 3:45 PM

[21p-C206-8] Performance verification of pnCCD camera for cosmic soft X-ray observation

〇(M2)Akihiro Yoshida¹, Junko Hiraga¹, Kenjiro Hujimoto¹, Makoto Arimoto², Daisuke Yonetoku², Naoki Ogino², Takanori Sakamoto³ (1.Kwansei Univ., 2.Kanazawa Univ., 3.Aoyama Gakuin Univ)

3:45 PM - 4:00 PM

[21p-C206-9] Feasibility study of DXAFS using deformable crystal at SAGA-LS

〇Akio Yoneyama¹, Hiroyuki Setoyama¹, Masahide Kawamoto¹, Yoshio Ichii² (1.SAGA Light Source, 2.JTEC Corp.)

4:00 PM - 4:15 PM

[21p-C206-10] Fundamental Study for 3D Dynamic X-ray Elastography of Visualizing Elastic modulus

〇(PC)Chika Kamezawa¹, Xiaoyu Liang², Akio Yoneyama^1,3, Kazuyuki Hyodo¹, Wataru Yashiro^2,4,5 (1.IMSS, KEK, 2.IMRAM, Tohoku Univ., 3.Saga-LS, 4.SRIS, Tohoku Univ., 5.Dept. Appl. Phys., Univ. Tokyo)

4:15 PM - 4:30 PM

[21p-C206-11] Light Sheet 3D Imaging using High Angle X-ray Scattering

〇Takayoshi Shimura¹, Kentaro Kajiwara², Naruki Tsuji², Takuma Kobayashi¹, Heiji Watanabe¹ (1.Osaka Univ., 2.JASRI)

4:30 PM - 4:45 PM

[21p-C206-12] Observation of laser joining to polymer materials by 4DCT using Talbot interferometer

〇Ryosuke Ueda¹, Yoshichika Seki¹, Masato Hoshino², Atsushi Momose¹ (1.Tohoku Univ., 2.JASRI)

4:45 PM - 5:00 PM

[21p-C206-13] Development of simulation framework for pixel-super resolution phase X-ray imaging using triangular phase grating

〇Ryosuke Ueda¹, Mingjian Cai¹, Atsushi Momose¹, Hiroki Kawakami², Pouria Zangi³, Martin Borner³, Otto Markus⁴, Joachim Schulz⁴ (1.Tohoku Univ., 2.Hamamatsu Photonics, 3.Karlsruhe Inst. Technology, 4.microworks)

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