Symposium

Special Program » XAFS Analysis for Chemists―Fundamental Guidance and the Cutting-Edge Applications

[B202-3pm] XAFS Analysis for Chemists―Fundamental Guidance and the Cutting-Edge Applications

Fri. Mar 25, 2022 1:00 PM - 3:40 PM B202 (Online Meeting)

Chair, Symposium organizer: Hikaru Takaya, Tetsuo Honma

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Opening Remarks (1:00 PM - 1:05 PM)

1:05 PM - 1:35 PM

[B202-3pm-01] Introduction to XAFS - its authorized measurement and analysis.

^○Kiyotaka Asakura¹ (1. Hokkaido Univ.)

[Lang.] Japanese

1:35 PM - 2:05 PM

[B202-3pm-02] Fundamental Guidance of High-Energy Resolution XAFS and their Applications

^○Naomi Kawamura¹ (1. Japan Synchrotron Radiation Research Institute)

[Lang.] Japanese

2:05 PM - 2:35 PM

[B202-3pm-03] XAFS imaging measurement using X-ray microscopy

^○Oki Sekizawa¹ (1. JASRI)

[Lang.] Japanese

2:35 PM - 3:05 PM

[B202-3pm-04] Analysis of lithium-ion batteries using synchrotron X-ray imaging

^○Hisao Yamashige¹ (1. Toyota Motor Corporation)

[Lang.] Japanese

3:05 PM - 3:35 PM

[B202-3pm-05] Sparse modeling of extended X-ray absorption fine structure

^○Ichiro Akai¹, Hiroyuki Kumazoe¹, Yasuhiko Igarashi², Fabio Iesari³, Kazunori Iwamitsu¹, Toshihiro Okajima³, Yoshiki Seno⁴, Masato Okada⁵ (1. Kumamoto Univ., 2. Univ. of Tsukuba, 3. Aichi SR, 4. SAGA-LS, 5. The Univ. of Tokyo)

[Lang.] Japanese

Closing Remarks (3:35 PM - 3:40 PM)

Session information

[B202-3pm] XAFS Analysis for Chemists―Fundamental Guidance and the Cutting-Edge Applications

[B202-3pm-01] Introduction to XAFS - its authorized measurement and analysis.

[B202-3pm-02] Fundamental Guidance of High-Energy Resolution XAFS and their Applications

[B202-3pm-03] XAFS imaging measurement using X-ray microscopy

[B202-3pm-04] Analysis of lithium-ion batteries using synchrotron X-ray imaging

[B202-3pm-05] Sparse modeling of extended X-ray absorption fine structure

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