The 102nd CSJ Annual Meeting

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Special Program » XAFS Analysis for Chemists―Fundamental Guidance and the Cutting-Edge Applications

[B202-3pm] XAFS Analysis for Chemists―Fundamental Guidance and the Cutting-Edge Applications

Fri. Mar 25, 2022 1:00 PM - 3:40 PM B202 (Online Meeting)

Chair, Symposium organizer: Hikaru Takaya, Tetsuo Honma

2:05 PM - 2:35 PM

[B202-3pm-03] XAFS imaging measurement using X-ray microscopy

○Oki Sekizawa1 (1. JASRI)

[Lang.] Japanese

Keywords:X-ray microscopy, X-ray absorption fine structure, X-ray fluorescence spectroscopy, X-ray microspectroscopy