[16a-A13-1~10] 7.2 Electron microscopes, evaluation, measurement and analysis

[16a-A13-10] SIMS Analysis of Cs containing Natural Specimens

^○Tetsuo Sakamoto¹, Kenji Ohishi¹, Satoru Nagashima², Isamu Kawakami³, Takeo Okumura⁴ (Kogakuin Univ.¹, TOYAMA², Atoh Komuten³, J-NOP⁴)

Keywords:二次イオン質量分析法,セシウム