Oral presentation

[16a-A13-1~10] 7.2 Electron microscopes, evaluation, measurement and analysis

Mon. Sep 16, 2013 9:15 AM - 12:00 PM A13 (TC1 3F-323)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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9:15 AM - 9:30 AM

△ [16a-A13-1] In-situ HRTEM observation of graphene growth catalyzed by cobalt nanoparticles

^○Takahiro Tamura¹, Yoshizo Takai¹ (Graduate School of Engineering, Osaka University)

9:30 AM - 9:45 AM

△ [16a-A13-2] Electronic state mapping of oxygen in metal oxide

^○Mitsutaka Haruta^{1, 2}, Takuro Nagai¹, Keiji Kurashima¹, Yuichi Shimakawa², Hiroki Kurata², Koji Kimoto¹ (NIMS¹, ICR Kyoto Univ²)

9:45 AM - 10:00 AM

△ [16a-A13-3] The Development of a New Type of Transmission Electron Microscope applying Accelerator Technologies

^○Nao Higashi¹, Takaaki Furuya², Yoshisato Funahashi², Kenji Ueno², Motoaki Sawabe², Michiru Nishiwaki², Hiroshi Sakai², Shinichiro Michizono², Masao Kuriki³, Satoru Yamashita⁴, Masahiro Yamamoo², Atsushi Enomoto², Yukihide Kamiya² (The Univ. of Tokyo/Graduate School of Science¹, KEK², Hiroshima Unv./ADSM³, The Univ. of Tokyo/ICEPP⁴)

10:00 AM - 10:15 AM

[16a-A13-4] Analysis of a magnetic-field-superposed-objective cathode lens using boundary charge method and boundary magnetic charge method

Kouhei Ichiki¹, Michinori Ishigami¹, Ryousuke Inagaki¹, ^○Hidekazu Murata¹, Hiroshi Shimoyama¹ (Meijo Univ.)

10:15 AM - 10:30 AM

[16a-A13-5] X-ray spectrum measured by using TES type microcalorimeter

^○Kenichi Shiiyama¹, Yuji Masaki², Shoichi Toh³, Keisuke Maehata², Keiichi Tanaka⁴, Kazuhiro Yasuda², Syo Matsumura² (Junshin Gakuen Univ.¹, Kyushu Univ.², HVEM Lab. Kyushu Univ.³, Hitachi High-Technologies Co.⁴)

Break （10:30 AM - 10:45 AM）

10:45 AM - 11:00 AM

[16a-A13-6] Simulation of fogging electron trajectories in Scanning Electron Microscope

^○(M1)SOSUKE HOSOI¹, KENTARO KUMAGAI¹, MASATOSHI KOTERA¹ (Osaka Institute of Technology)

11:00 AM - 11:15 AM

[16a-A13-7] Measurement of two-dimensional potential distribution at an insulator film on conductive substrate irradiated by electron beam

^○(M1)Kentaro Kumagai¹, Sosuke Hosoi¹, Masaru Otani¹, Masatoshi Kotera¹ (Osaka Institute of Technology)

11:15 AM - 11:30 AM

[16a-A13-8] The drift reduction of Gallium Nitride layer SEM-EBSD mapping with Ion Liquid

^○Hirobumi Morita¹, Takashi Egawa¹, Kazutaka Nimura² (Nagoya Institute of Technology¹, Hitachi High-Technologies²)

11:30 AM - 11:45 AM

[16a-A13-9] The drift reduction of Gallium Nitride layer SEM-EBSD mapping by Focused Ion Beam and carbon deposition

^○Hirobumi Morita¹, Takashi Egawa¹, Hideki Hirota², Kazutaka Nimura² (Nagoya Institute of Technology¹, Hitachi High-Technologies²)

11:45 AM - 12:00 PM

[16a-A13-10] SIMS Analysis of Cs containing Natural Specimens

^○Tetsuo Sakamoto¹, Kenji Ohishi¹, Satoru Nagashima², Isamu Kawakami³, Takeo Okumura⁴ (Kogakuin Univ.¹, TOYAMA², Atoh Komuten³, J-NOP⁴)

Sessions

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis