The 74th JSAP Autumn Meeting,2013

Presentation information

Oral presentation

Joint session K » Joint session K

[17p-B4-1~18] Joint session K

Tue. Sep 17, 2013 1:30 PM - 6:15 PM B4 (TC2 1F-106)

5:15 PM - 5:30 PM

[17p-B4-15] Scale Dependence of Heating and Degradation Phenomena for Oxide Thin-Film Transistor

Satoshi Urakawa1, Shigekazu Tomai2, Masashi Kasami2, Koki Yano2, Wang Dapeng3, Mamoru Furuta3, Masahiro Horita1,4, Yasuaki Ishikawa1,4, Yukiharu Uraoka1,4 (NAIST1, Idemitsu Co., Ltd2, Kochi Univ. of Tech.3, CREST4)

Keywords:酸化物半導体,薄膜トランジスタ,発熱解析