5:15 PM - 5:30 PM
[17p-B4-15] Scale Dependence of Heating and Degradation Phenomena for Oxide Thin-Film Transistor
Keywords:酸化物半導体,薄膜トランジスタ,発熱解析
Oral presentation
Joint session K » Joint session K
Tue. Sep 17, 2013 1:30 PM - 6:15 PM B4 (TC2 1F-106)
5:15 PM - 5:30 PM
Keywords:酸化物半導体,薄膜トランジスタ,発熱解析