[18p-P9-1~10] 13.3 Insulator technology

▼ [18p-P9-1] Characterization of Interface Traps in Au/Al₂O₃/GeO_x/Ge MOS Structures

^○JuChin Lin¹, Rui Zhang^1,2, Noriyuki Taoka³, Mitsuru Takenaka¹, Shinichi Takagi¹ (The University of Tokyo¹, Nanjing University², Nagoya University³)

Keywords:Interface Traps