10:15 AM - 10:30 AM
[19a-C10-4] Investigation on Crystal Orientation Dependence of Corrosion of Copper Wire by Atomic Force Microscopy
Keywords:原子間力顕微鏡,腐食,結晶方位
Oral presentation
13. Semiconductors A (Silicon) » 13.4 Interconnection technology
Thu. Sep 19, 2013 9:30 AM - 12:00 PM C10 (TC3 2F-207)
10:15 AM - 10:30 AM
Keywords:原子間力顕微鏡,腐食,結晶方位