The 74th JSAP Autumn Meeting,2013

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.6 Silicon devices / Integration technology

[19a-C8-1~12] 13.6 Silicon devices / Integration technology

Thu. Sep 19, 2013 9:00 AM - 12:15 PM C8 (TC3 2F-201)

9:00 AM - 9:15 AM

[19a-C8-1] [Young Scientist Oral Presentation Award Speech](15 min.) Drain-Current Fluctuation during Dynamic Gate Bias in Si MOSFETs due to Random Telegraph Noise

Wei Feng1,2, Keisaku Yamada1,2, Kenji Ohmori1,2 (Univ. of Tsukuba1, JST-CREST2)

Keywords:ランダムテレグラフノイズ,ドレイン電流変動,MOSFET