[19a-C8-1~12] 13.6 Siデバイス／集積化技術

▲ [19a-C8-8] Recovery Behaviors of |Vth| Shift of pFETs by High-Voltage OFF-State and ON-State Stress for Post-Fabrication SRAM Cell Stability Self-Improvement

^○Nurul Ezaila Alias¹，Anil Kumar¹，Takuya Saraya¹，Shinji Miyano²，Toshiro Hiramoto¹ (IIS, Univ. of Tokyo¹，STARC²)

キーワード：OFF-state stress, ON-state stress,Variability,SRAM