The 74th JSAP Autumn Meeting,2013

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Poster presentation

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[19a-P3-1~27] 6.3 Oxide-based electronics

Thu. Sep 19, 2013 9:30 AM - 11:30 AM P3 (Davis Memorial Auditorium)

9:30 AM - 11:30 AM

[19a-P3-18] Experimental Determination of Band Discontinuities at NiO/Semiconductor or Metal Heterointerfaces using Photoelectron Yield Spectroscopy

○Daisuke Kawade1, Kazuma Moriyama1, Shigefusa ChiChibu2, Mutsumi Sugiyama1 (Faculty of Sci & Tech./RIST, Tokyo Univ. of Science1, IMRAM, Tohoku Univ.2)

Keywords:NiO,光電子収量分光法,透明