Numerical simulation of current noise caused by potential fluctuation in semiconductor nanowire FETs

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.7 Simulation

Thu. Sep 19, 2013 1:30 PM - 3:15 PM C9 (TC3 2F-202)

2:00 PM - 2:15 PM

^○Yuki Furubayashi¹, Matsuto Ogawa¹, Satofumi Souma¹ (Kobe univ.¹)

Keywords:半導体,ナノワイヤ,ノイズ