[20a-C9-1~12] 13.1 Basic properties and their evaluation

▲ [20a-C9-6] Photocarrier Buildup Effects in Si Nanostripes Measured by Scanning Probe Microscopy

^○Leonid Bolotov^1,2, Tetsuya Tada², Koichi Fukuda², Vladimir Poborchii², Toshihiko Kanayama² (Univ. of Tsukuba¹, AIST²)

Keywords:フォトキャリヤー,半導体,ﾌﾟﾛｰﾌﾞ顕微鏡