Session information

Regular sessions(Poster presentation)

09. Applied Materials Science » 9.3 Nanoelectronics

[29a-PB3-1~9] 9.3 Nanoelectronics

Fri. Mar 29, 2013 9:30 AM - 11:30 AM PB3 (2nd gymnasium)

Poster Session 9:30〜11:30(PB)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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[29a-PB3-1] Evaluation of two-dimensional device-error-redundant single-electron oscillator system

^○（M1）Yoshisato Murakami¹, Takahide Oya¹ (Yokohama National University¹)

[29a-PB3-2] Designing and Evaluating the Single-Electron Circuits Applying Collision-Based Computing

Shunsuke Hayashi¹, ^○Takahide Oya¹ (Yokohama National Univ.¹)

[29a-PB3-3] Design of single-electron Brownian ratchet circuits by harnessing noise energy

^○Yusuke Kawamura¹, Takahide Oya¹ (Yokohama National Univ.¹)

[29a-PB3-4] △A neuron device combining a FinFET and nanodisk array structures

^○Takashi Tohara¹, Liang Haichao¹, Kazuhiko Endo², Makoto Igarashi³, Seiji Samukawa³, Meishoku Masahara², Takashi Morie¹ (Kyushu Inst.¹, AIST², Tohoku Univ.³)

[29a-PB3-5] Fabrication and characterization of Ni nano structure by Electromigration

^○Hayato Ochi¹, Yosuke Murakami¹, Koichi Hamada¹, Masashi Arita¹, Yasuo Takahashi¹ (Hokkaido Univ.¹)

[29a-PB3-6] Control of Electrical Properties of Series-Connected Nanogaps during Field-Emission-Induced Electromigration

^○Souichi Ishii¹, Ryutaro Suda¹, Mitsuki Ito¹, Akihiro Hirata¹, Jun-ichi Shirakashi¹ (Tokyo Univ. Agr. & Tech.¹)

[29a-PB3-7] Nanomachining of Graphene Using Scanning Probe Microscopy

^○Taku Yoshida¹, Ryutaro Suda¹, Takanari Saito¹, Tseng Ampere. A.², Jun-ichi Shirakashi¹ (Tokyo Univ. Agr. & Tech.¹, Arizona State University²)

[29a-PB3-8] Mechanical Cleaning of Graphene Surfaces Using Scanning Probe Microscopy

^○Ryutaro Suda¹, Takanari Saito¹, Taku Yoshida¹, Tseng Ampere. A.², Jun-ichi Shirakashi¹ (Tokyo Univ. Agr. & Tech.¹, Arizona State University²)

[29a-PB3-9] Investigation of Temperature Distribution of Graphene under Current Flow Using In-Situ NIR CCD Imaging System

^○Takanari Saito¹, Ibuki Atsumo¹, Ryutaro Suda¹, Mitsuki Ito¹, Jun-ichi Shirakashi¹ (Tokyo Univ. Agr. & Tech.¹)

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