[28p-B9-1~10] 9.3 Nanoelectronics

[28p-B9-8] △In-situ observation of the electromigration in the vicinity of grain boundary

^○Yosuke Murakami¹, Hayato Ochi¹, Masashi Arita¹, Kouichi Hamada¹, Yasuo Takahashi¹, Seiji Takeda² (IST, Hokkaido Univ.¹, ISIR, Osaka Univ.²)

Keywords:エレクトロマイグレーション、透過型電子顕微鏡