[28p-G2-10] △Thermal stability of Metal/High-k/GeO2/Ge stacks fabricated by MBD method
Keywords:ゲルマニウム、MOS、Metal/High-k
Regular sessions(Oral presentation)
13. Semiconductors A (Silicon) » 13.3 Insulator technology
Thu. Mar 28, 2013 2:30 PM - 6:45 PM G2 (B5 1F-2102)
Keywords:ゲルマニウム、MOS、Metal/High-k