[28p-G2-11] △Correlation between Interface Structures due to Thermal Oxidation and Interface Properties at Al2O3/Ge Interfaces
Keywords:Al2O3/Ge、熱酸化、界面特性
Regular sessions(Oral presentation)
13. Semiconductors A (Silicon) » 13.3 Insulator technology
Thu. Mar 28, 2013 2:30 PM - 6:45 PM G2 (B5 1F-2102)
Keywords:Al2O3/Ge、熱酸化、界面特性