The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

13. Semiconductors A (Silicon) » 13.1 Basic properties and their evaluation

[29a-G6-1~12] 13.1 Basic properties and their evaluation

Fri. Mar 29, 2013 9:00 AM - 12:15 PM G6 (B5 1F-2106)

[29a-G6-8] Observation of Deuterium Distribution in Silicon by Atom Probe Tomography

○(P)Hisashi Takamizawa1, Katsuya Hoshi1, Yasuo Shimizu1, Koji Inoue1, Fumiko Yano1,2, Shinji Nagata1, Tatsuo Shikama1, Yasuyoshi Nagai1 (IMR Tohoku Univ.1, Tokyo City Univ.2)

Keywords:atom probe、3次元アトムプローブ