The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

07. Beam Technology and Nanofabrication » 7.6 Ion beams

[29p-B2-1~18] 7.6 Ion beams

Fri. Mar 29, 2013 1:30 PM - 6:15 PM B2 (K2 3F-1302)

[29p-B2-11] △Evaluation of surface condition of MRAM material after gas cluster ion beam etching

Ryo Hinoura1, Akira Yamaguchi1, Noriaki Toyoda1, Kenichi Hara2, Isao Yamada1 (Hyougo univ.1, Tokyo Electron2)

Keywords:ガスクラスターイオンビーム