The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

[30a-B1-1~10] 7.2 Electron microscopes, evaluation, measurement and analysis

Sat. Mar 30, 2013 9:00 AM - 11:45 AM B1 (K2 3F-1301)

[30a-B1-3] Characteristics of an Optical Fiber Array Detector in the STEM

Takafumi Ishida1, Tetsuji Kodama1, Tadahiro Kawasaki2, Keiko Ogai3, Takashi Ikuta4 (Meijo Univ.1, Nagoya Univ.2, APCO Ltd.3, Osaka Electro-Communication Univ.4)

Keywords:位相計測、検出器、STEM