[30a-B1-1~10] 7.2 Electron microscopes, evaluation, measurement and analysis

[30a-B1-4] Visualization of Semiconducting p-n Junction by Newly-Developed Phase Imaging Method Based on Electron Diffraction Pattern

^○Jun Yamasaki¹, Keisuke Ohta², Shigeyuki Morishita², Hirokazu Sasaki³, Nobuo Tanaka¹ (Nagoya Univ.¹, Nagoya Univ.², Furukawa Electric Co., Ltd.³)

Keywords:回折顕微法、位相イメージング、p-n接合