Measurement and Analysis of Off-Leakage Current in IGZO-TFTs

Presentation information

Oral presentation

Joint Session K "Wide bandgap oxide semiconductor materials and devices" » Nanocarbon Technology

Tue. Mar 18, 2014 1:15 PM - 6:30 PM E10 (E204)

5:00 PM - 5:15 PM

^○Go Wakimura¹, Yoshimitsu Yamauchi¹, Toshimasa Matsuoka¹, Yoshinari Kamakura¹ (Osaka Univ.¹)

Keywords:IGZO