5:30 PM - 5:45 PM
△ [18p-E10-17] Analysis of degradation phenomenon in oxide thin-film transistor caused by self-heating under pulse voltage stress
Keywords:パルスストレス,TAOS,発熱劣化
Oral presentation
Joint Session K "Wide bandgap oxide semiconductor materials and devices" » Nanocarbon Technology
Tue. Mar 18, 2014 1:15 PM - 6:30 PM E10 (E204)
5:30 PM - 5:45 PM
Keywords:パルスストレス,TAOS,発熱劣化