[19a-D9-1~13] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19a-D9-10] EXAFS measurement of encapsulated Bi nanoline in Si

^○Koichi Murata^1,2, Kiyofumi Nitta³, Tomoya Uruga³, Yasuko Terada³, Wataru Yashiro⁴, Koh-ichi Nittoh¹, Osami Sakata¹, Kazushi Miki^1,2 (NIMS¹, Univ. of Tsukuba², JASRI³, Tohoku Univ.⁴)

Keywords:シリコン,ビスマス,EXAFS