The 61st JSAP Spring Meeting, 2014

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19p-D9-1~18] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Wed. Mar 19, 2014 2:00 PM - 7:00 PM D9 (D315)

2:15 PM - 2:30 PM

[19p-D9-2] First-principles analysis on stability of contamination metal atoms in β-Si3N4 surface

○(M2)Syunsuke Kobayashi1, Daiki Shibata1, Koji Sueoka1, Jun Komachi2, Koichiro Saga2 (Okayama Pref. Univ.1, SONY Corp.2)

Keywords:β-Si3N4表面,第一原理解析,SiN窒化膜表面