The 62nd JSAP Spring Meeting, 2015

Presentation information

Oral presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[12p-A18-1~18] 15.8 Crystal evaluation, impurities and crystal defects

Thu. Mar 12, 2015 2:00 PM - 7:00 PM A18 (6A-208)

5:45 PM - 6:00 PM

[12p-A18-14] Proximity Gettering of Carbon Cluster Ion Irradiated Silicon Wafers(2) -Hydrogen Diffusion Behavior After Epitaxial Growth-

〇Ryosuke Okuyama1, Ryo Hirose1, Takeshi Kadono1, Takuro Iwanaga1, Yoshihiro Koga1, Hidehiko Okuda1, Kazunari Kurita1 (1.SUMCO Corp.)

Keywords:hydrogen diffusion behavior in silicon wafer,Carbon cluster ion irradiation