2:15 PM - 2:30 PM
[16p-C302-3] Study on wet-oxidized 4H-SiC m-face MOS interface by SiO2 microscopic structure and electric characteristics
Keywords:SiC
Oral presentation
15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)
Fri. Sep 16, 2016 1:45 PM - 4:15 PM C302 (Nikko Houou)
Dai Okamoto(Univ. of Tsukuba)
2:15 PM - 2:30 PM
Keywords:SiC