The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[19a-S223-1~13] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Sat. Mar 19, 2016 9:00 AM - 12:30 PM S223 (S2)

Nobuya Mori(Osaka Univ.)

11:15 AM - 11:30 AM

[19a-S223-9] Simulation study on the threshold voltage definition of TFET

Yoshiaki Mori1, Shingo Sato1, Yasuhisa Omura1 (1.Kansai Univ.)

Keywords:tunnel FET,threshold voltage,universality of definition

In this paper, we show a new possible definition of the threshold voltage of TFET. A normalized transconductance takes its maximal value at the threshold voltage. This definition has the universality for TFETs having practical device parameters.