The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.3 Insulator technology

[20a-S221-1~12] 13.3 Insulator technology

Sun. Mar 20, 2016 9:00 AM - 12:15 PM S221 (S2)

Takeshi Ishida(HITACHI), Masato Koyama(TOSHIBA)

10:15 AM - 10:30 AM

[20a-S221-6] Effects of Gate Insulators on Threshold Voltage of Amorphous Silicon TFTs

Masahiko Ando1, Masatoshi Wakagi1, Ken-ichi Onisawa2 (1.Hitachi R&D, 2.Koga-Soken)

Keywords:amorphous silicon,TFT,gate insulator

There are few reports on the reason for SiNx as a typical gate insulator material of amorphous silicon (a-Si) TFTs in contrast to thermal SiOx for crystalline silicon (c-Si) FETs. We would like to clarify the dependence of the threshold voltage and threshold voltage shift under gate DC bias stress application of a-Si TFTs by appling four kinds of gate stucks composed of SiOx and SiNx as the bulk and interface.