2:00 PM - 2:15 PM
▲ [20p-S221-2] Improvement of MOS Interfaces of La2O3/InGaAs by Ultra-thin ALD Al2O3 Capping Layers
Keywords:InGaAs,La2O3,Traps
Oral presentation
13 Semiconductors » 13.3 Insulator technology
Sun. Mar 20, 2016 1:45 PM - 6:15 PM S221 (S2)
Takanobu Watanabe(Waseda Univ.), Hiroshi Funakubo(Titech)
2:00 PM - 2:15 PM
Keywords:InGaAs,La2O3,Traps