The 63rd JSAP Spring Meeting, 2016

Presentation information

Poster presentation

13 Semiconductors » 13.4 Si wafer processing /Si based thin film /MEMS/Integration technology

[21p-P17-1~26] 13.4 Si wafer processing /Si based thin film /MEMS/Integration technology

Mon. Mar 21, 2016 4:00 PM - 6:00 PM P17 (Gymnasium)

4:00 PM - 6:00 PM

[21p-P17-24] Mechanical Property of Cu-Ni-Si Alloy Evaluated by Micro-Compression and Micro-Tensile Testing for Application in MEMS

〇(M1)Sari Yanagida1,2, Akiyoshi Araki1, Tso-Fu Mark Chang1,2, Chun-Yi Chen1,2, Takashi Nagoshi3, Equo Kobayashi1, Hideki Hosoda1, Tatsuo Sato1, Masato Sone1,2 (1.Tokyo Tech, 2.CREST, 3.AIST)

Keywords:Mcro mechanical testing,Cu-Ni-Si alloy,MEMS