Michiru Hogyoku

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Speaker, Author, Co-Author

Tue. Sep 5, 2017 1:45 PM - 4:30 PM C11 (Office 1)

Oral presentation
| 13 Semiconductors
| 13.3 Insulator technology

[5p-C11-1~10] 13.3 Insulator technology

6.1と13.3と13.5のコードシェアセッションあり

3:30 PM - 3:45 PM

[5p-C11-7] Defect Profiling of RTN Traps under High Electric Fields ~ Theoretical Extrapolation Based on Non-radiative Multiphonon Transition ~

〇Michiru Hogyoku¹, Takashi Izumida¹, Seiji Onoue¹ (1.Toshiba Memory Corp.)