The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[6a-A201-1~12] 15.6 Group IV Compound Semiconductors (SiC)

Wed. Sep 6, 2017 9:00 AM - 12:15 PM A201 (201)

Koji Kita(Univ. of Tokyo), Hiroaki Hanafusa(Hiroshima Univ.)

10:15 AM - 10:30 AM

[6a-A201-6] 400℃ operation of SiC n- and p-channel JFETs fabricated by ion implantation into a high-purity semi-insulating substrate

Mitsuaki Kaneko1, Tsunenobu Kimoto1 (1.Kyoto Univ.)

Keywords:SiC, JFET, ion implantation

SiC is an attractive material for devices operating under harsh environment. As for logic applications, considering the total energy loss, complementary logic ICs are desirable, which requires both n-type and p-type devices on a common substrate. In this study, n-channel and p-channel JFETs were fabricated by ion implantation into high-purity semi-insulating substrates and 400℃ operations of the JFETs were confirmed.