The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects

[6a-A503-1~13] 15.7 Crystal evaluation, impurities and crystal defects

Wed. Sep 6, 2017 9:00 AM - 12:30 PM A503 (503)

Yuta Nagai(GlobalWafers Japan), Shotaro Takeuchi(Ohsaka Univ.)

11:15 AM - 11:30 AM

[6a-A503-9] Dependence of radial temperature difference for dislocation density during silicon crystal growth

Satoshi Nakano1, Xin Liu1, Xue-Feng Han1, Koichi Kakimoto1 (1.RIAM, Kyushu Univ.)

Keywords:silicon, dislocation

It has been reported that dislocation density is increased during cooling process and slow cooling is better for decrease of multiplication of dislocation density due to decrease of temperature gradient in the Si crystal. In this study, we investigated the influence of temperature distribution in the Si crystal and cooling rate on dislocation multiplication by numerical analysis.