The 78th JSAP Autumn Meeting, 2017

Presentation information

Symposium (Oral)

Symposium » Materials Science and Advanced Electronics Created by Singularity of Nitride Semiconductors ~Crystal Growth, Characterization and Application for Advanced GaN Electron Devices~

[6p-A301-1~7] Materials Science and Advanced Electronics Created by Singularity of Nitride Semiconductors ~Crystal Growth, Characterization and Application for Advanced GaN Electron Devices~

Wed. Sep 6, 2017 1:00 PM - 4:30 PM A301 (Main Hall)

Tamotsu Hashizume(Hokkaido Univ.)

2:10 PM - 2:40 PM

[6p-A301-4] HVPE growth of high-purity GaN epitaxial layers

Hajime Fujikura1, Taichiro Konno1, Takehiro Yoshida1, Fumimasa Horikiri1 (1.SCIOCS)

Keywords:GaN, HVPE, high-purity

Highly-pure GaN epitaxial layers were successfully grown by a quart-free HVPE system. All impurity concentrations measured by SIMS (Si, O, C, H, Fe, Cr, Ni, Ti etc.) were below the detection limit. The high-purity layers displayed an insulating nature in the absence of a dopant; by Si doping, the electron concentration could be controlled over a wide range, down to 1x1015/cm3.