The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[7a-A201-1~8] 15.6 Group IV Compound Semiconductors (SiC)

Thu. Sep 7, 2017 9:00 AM - 11:00 AM A201 (201)

Kazutoshi Kojima(AIST)

9:00 AM - 9:15 AM

[7a-A201-1] Evaluation of Susceptor Coating Film for SiC Epitaxial Reactor Cleaning Using ClF3 Gas

Kohei Shioda1, 〇Ryohei Kawasaki1, Hitoshi Habuka1, Hideki Ito2, Shin-ichi Mitani2, Yoshinao Takahashi3 (1.Yokohama Nat. Univ., 2.NuFlare Technologies, 3.Kanto Denka Kogyo)

Keywords:Silicon carbide, Chlorine trifluoride, Cleaning

The fluorination of pyrolytic carbon film was evaluated for the application of the SiC CVD reactor cleaning. At the temperatures less than 480°C, the fluorination was moderate and did not deteriorate the surface morphology.