The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

21 Joint Session K » 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[19a-224A-1~8] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

Wed. Sep 19, 2018 9:30 AM - 11:30 AM 224A (224-1)

Takumi Ikenoue(Kyoto Univ.)

11:00 AM - 11:15 AM

[19a-224A-7] Fabrication of GaON Thin Films Using Mist-CVD

Masayuki Nakamura1, Takayuki Kobayashi1, Toshiaki Tatsuta1, Shin-ichi Motoyama1 (1.Samco Inc.)

Keywords:mist CVD, semiconductor

Mist-CVD is the deposition method using mist of the solution which contains raw materials. The mist is fabricated using ultrasonic vibrator and carried to the reactor. In the reactor, the mist is evaporated on the heated substrate and the thin film is deposited. Although various films have been deposited using mist-CVD, most of them are oxides. In this study, we tried to deposit GaON thin films using GaCl3 and melamine.