Takeshi Uruma

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 9:00 AM - 12:30 PM F210 (61-210)

Oral presentation
| 6 Thin Films and Surfaces
| 6.6 Probe Microscopy

[18a-F210-1~13] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

9:45 AM - 10:00 AM

△ [18a-F210-4] Observation of an n^- layer of Si fast recovery diode by Kelvin probe force microscopy

〇(D)Takeshi Uruma¹, Nobuo Satoh², Hidekazu Yamamoto², Futoshi Iwata¹ (1.Graduate School of Sci. and Tech., Shizuoka Univ., 2.Chiba. Ins. of Tech.)