Hiroshi Kaneta

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 1:15 PM - 7:30 PM D103 (56-103)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[18p-D103-1~23] 15.7 Crystal characterization, impurities and crystal defects

5:00 PM - 5:15 PM

[18p-D103-14] Concentration of vacancies in silicon wafers quenched at high-temperature thermal equilibrium measured by low-temperature ultrasonic technique

〇Hiroshi Kaneta¹, Yuichi Nemoto², Mitsuhiro Akatsu³, Keisuke Mitsumoto² (1.Kyushu Inst. of Tech., 2.Niigata Univ., 3.Phys. Dpt. Niigata Univ.)