Hidekazu Yamamoto

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 1:15 PM - 7:30 PM D103 (56-103)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[18p-D103-1~23] 15.7 Crystal characterization, impurities and crystal defects

5:45 PM - 6:00 PM

[18p-D103-17] Evaluation of Si fast recovery diode by multifunctional scanning probe microscope

〇Hidekazu Yamamoto¹, Takeshi Uruma², Nobuo Satoh¹, Futoshi Iwata² (1.Chiba Inst. of Tech., 2.Graduate School of Sci. and Tech., Shizuoka Univ.)