Masataka Murakami

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 1:15 PM - 7:30 PM D103 (56-103)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[18p-D103-1~23] 15.7 Crystal characterization, impurities and crystal defects

6:15 PM - 6:30 PM

[18p-D103-19] Stress Characterization of SiO₂ / SiC interface by Scanning Near-Field Optical Raman Microscope

〇Masataka Murakami¹, Yasuhiko Fujita¹ (1.Toray Research Center)