[18p-C201-1~7] Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

[18p-C201-3] Development of a vacuum-type electrospray droplet ion gun and its application to TOF-SIMS

〇Satoshi Ninomiya¹, Yuichiro Takagi¹, Lee Chuin Chen¹, Kenzo Hiraoka² (1.Univ. Yamanashi, 2.Univ.Yamanashi CERC)

Keywords:secondary ion mass spectrometry, electrospray water droplet

We have developed a technique for producing a stable electrospray of aqueous solutions in a vacuum, and we designed the prototype of a vacuum-type electrospray droplet ion (V-EDI) beam gun. This V-EDI gun was installed in the triple focus time-of-flight analyzer, and we are evaluating the desorption and ionization efficiencies of the V-EDI beams. In this presentation, I will introduce the story of the development of the V-EDI gun and the problems of the TOF-SIMS measurements using the V-EDI beam as a primary beam will be discussed.