5:00 PM - 5:15 PM
[18p-G203-15] Burst Error Reduction for Improvement of LDPC Correction Capability in TLC NAND Flash Memories
Keywords:NAND flash memory, Low-density parity-check code, Reliability
Oral presentation
13 Semiconductors » 13.5 Semiconductor devices and related technologies
Sun. Mar 18, 2018 1:15 PM - 6:00 PM G203 (63-203)
Masumi Saitoh(TOSHIBA), Kousuke Miyaji(Shinshu Univ.)
5:00 PM - 5:15 PM
Keywords:NAND flash memory, Low-density parity-check code, Reliability